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Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
- Journal article
- Creator
-
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
;Shuichi Ogawa (author) (Search by this author)Akitaka Yoshigoe (author) (Search by this author) - Keyword
- Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
- Date published
- 2024-12-03
- Updated at
- 2025-01-21 12:30:34 +0900