Reliability evaluation scheme for ceramics based on defect size distribution inversely estimated from standardized tests
- Journal article
- Creator
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;Taiyo Maeda (author) (Search by this author)Graduate School of Yokohama National UniversityToshio Osada (author) (Search by this author)Research Center for Structural Materials/Materials Manufacturing Field/High-Reliability Heat-Resistant Materials Group, National Institute for Materials Science
;
Shingo Ozaki (author) (Search by this author)
https://orcid.org/0000-0003-3450-6774
(unauthenticated)
Faculty of Engineering, Yokohama National University
- Keyword
- Ceramics, Defect, Extream value statistics, Strength, Weibull plot
- Date published
- 2025-05-12
- Updated at
- 2025-07-04 08:30:32 +0900
Finite Element Analysis of R‐Curve Behavior in Ceramics Using the Damage Model Based on the Cohesive‐Zone Relationship
- Journal article
- Creator
-
;Mostafizur Rahman (author) (Search by this author);Taiyo Maeda (author) (Search by this author)Toshio Osada (author) (Search by this author)National Institute for Materials Science
;
Shingo Ozaki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Ceramics, Damage model, Finite element analysis, R-curve behavior, Toughness
- Date published
- 2025-09-17
- Updated at
- 2025-09-26 16:30:21 +0900
Data-driven approach for rapid prediction of strength scatter in brittle ceramics using deep learning and swarm optimization
- Journal article
- Creator
-
;Taiyo Maeda (author) (Search by this author)Graduate School of Yokohama National University;Muhammad Aiman bin Musa (author) (Search by this author)Graduate School of Yokohama National UniversityToshio Osada (author) (Search by this author)Research Center for Structural Materials/Materials Manufacturing Field/High-Reliability Heat-Resistant Materials Group, National Institute for Materials Science
;
Shingo Ozaki (author) (Search by this author)Faculty of Engineering, Yokohama National University
- Keyword
- Ceramics, Fracture statistics, Defect distribusion, Multilayer perceptron, Inverse analysis
- Date published
- 2026-12-31
- Updated at
- 2026-04-22 16:01:04 +0900