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Conference presentation(1)
Journal article(1)
Keyword
computer vision (2)
atomic resolution (1)
automatic drift compensation (1)
bring your own device (1)
canning probe microscopy (1)
internet of things (1)
outdoor monitoring system (1)
photonic crystal (1)
real time image analysis (1)
strain sensor (1)
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Keyword: computer vision
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2 records found.
Automatic drift compensation for nanoscale imaging using feature point matching
Journal article
Creator
Zhuo Diao
(author) (
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)
Zhuo Diao
;
Keiichi Ueda
(author) (
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)
Keiichi Ueda
;
Linfeng Hou
(author) (
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)
Linfeng Hou
;
Hayato Yamashita
(author) (
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)
Hayato Yamashita
;
Oscar Custance
(author) (
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)
https://orcid.org/0000-0001-7931-603X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Oscar Custance
;
Masayuki Abe
(author) (
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)
Masayuki Abe
Keyword
canning probe microscopy
,
computer vision
,
automatic drift compensation
,
atomic resolution
Date published
2023-03-20
Updated at
2024-12-10 16:56:37 +0900
IoT-powered remote sensing and handy real-time evaluation of strain imaging sheets installed on aged outdoor structures
Conference presentation
Creator
TODOROKI, Shin-ichi
(author) (
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)
https://orcid.org/0000-0003-3986-1900
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
TODOROKI, Shin-ichi
;
FUDOUZI, Hiroshi
(author) (
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)
https://orcid.org/0000-0003-1442-4667
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
FUDOUZI, Hiroshi
;
TSUCHIYA, Koichi
(author) (
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)
https://orcid.org/0000-0003-0267-2727
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
TSUCHIYA, Koichi
Keyword
structural color
,
bring your own device
,
computer vision
,
internet of things
,
outdoor monitoring system
,
photonic crystal
,
real time image analysis
,
strain sensor
Date published
2019-04-01
Updated at
2022-11-15 17:15:05 +0900
Keyword
computer vision
(2)
atomic resolution
(1)
automatic drift compensation
(1)
bring your own device
(1)
canning probe microscopy
(1)
internet of things
(1)
outdoor monitoring system
(1)
photonic crystal
(1)
real time image analysis
(1)
strain sensor
(1)
structural color
(1)
RDE metadata def
RDE invoice schema
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