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Article and Dataset
Collection
Resource type
Journal article(2)
Keyword
AHE (1)
Ferrimagnet (1)
Mn4N (1)
XAS (1)
XMCD (1)
density functional theory (1)
electron paramagnetic resonance (1)
magnetic compensation (1)
point defects (1)
semiconductor (1)
(more)
License
Creative Commons BY Attribution 4.0 International (2)
File type
application/pdf (2)
application/zip (1)
2 records found. Displaying records 1 to 2.
Current status of room temperature magnetic compensation in impurity-doped Mn4N epitaxial thin films
Journal article
Creator
Tomohiro Yasuda
(author) (
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)
a Degree Programs in Pure and Applied Sciences, Graduate School of Science and Technology, University of Tsukuba
Tomohiro Yasuda
;
Takashi Suemasu
(author) (
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)
Takashi Suemasu
Keyword
Ferrimagnet
,
Mn4N
,
magnetic compensation
,
XAS
,
XMCD
,
AHE
Date published
2026-12-31
Updated at
2026-06-24 11:43:16 +0900
Point defects in BaSi2 identified and analyzed by electron paramagnetic resonance, photoluminescence and density functional theory
Journal article
Creator
Takuma Sato
(author) (
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)
Takuma Sato
;
Jean-Marie Mouesca
(author) (
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)
Jean-Marie Mouesca
;
Anne-Laure Barra
(author) (
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)
Anne-Laure Barra
;
Didier Gourier
(author) (
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)
Didier Gourier
;
Motoharu Imai
(author) (
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)
https://orcid.org/0000-0002-5848-113X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Motoharu Imai
;
Takashi Suemasu
(author) (
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)
Takashi Suemasu
;
Serge Gambarelli
(author) (
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)
Serge Gambarelli
Keyword
silicide
,
semiconductor
,
point defects
,
electron paramagnetic resonance
,
density functional theory
Date published
2024-07-29
Updated at
2024-08-26 12:30:40 +0900
Keyword
AHE
(1)
Ferrimagnet
(1)
Mn4N
(1)
XAS
(1)
XMCD
(1)
density functional theory
(1)
electron paramagnetic resonance
(1)
magnetic compensation
(1)
point defects
(1)
semiconductor
(1)
silicide
(1)
RDE metadata def
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Collection
Resource type
Journal article(2)
Keyword
AHE (1)
Ferrimagnet (1)
Mn4N (1)
XAS (1)
XMCD (1)
density functional theory (1)
electron paramagnetic resonance (1)
magnetic compensation (1)
point defects (1)
semiconductor (1)
(more)
License
Creative Commons BY Attribution 4.0 International (2)
File type
application/pdf (2)
application/zip (1)