Tip-Based Cleaning and Smoothing Improves Performance in Monolayer MoS₂ Devices

Journal article

Creator

Sihan Chen (author) (Search by this author)

Sihan Chen ;

Jangyup Son (author) (Search by this author)

Jangyup Son ;

Siyuan Huang (author) (Search by this author)

Siyuan Huang ;

Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Rashid Bashir (author) (Search by this author)

Rashid Bashir ;

Arend M. van der Zande (author) (Search by this author)

Arend M. van der Zande ;

William P. King (author) (Search by this author)

William P. King

Keyword

Van der Waals devices, atomic force microscopy, MoS2 transistors

Date published

2021-02-09

Updated at

2025-03-03 16:30:23 +0900