Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing

Journal article

Creator

Jun Uzuhashi (author) (Search by this author)

https://orcid.org/0000-0003-2023-8158

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Jun Chen (author) (Search by this author)

https://orcid.org/0000-0003-4272-2653

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Jun Chen ;

Ashutosh Kumar (author) (Search by this author)

https://orcid.org/0000-0002-8085-1598 (unauthenticated)

National Institute for Materials Science

Ashutosh Kumar ;

Wei Yi (author) (Search by this author)

https://orcid.org/0000-0001-5040-8416 (unauthenticated)

National Institute for Materials Science

Wei Yi ;

Tadakatsu Ohkubo (author) (Search by this author)

https://orcid.org/0000-0003-3548-1951

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo ;

Ryo Tanaka (author) (Search by this author)

Ryo Tanaka ;

Shinya Takashima (author) (Search by this author)

Shinya Takashima ;

Masaharu Edo (author) (Search by this author)

Masaharu Edo ;

Kacper Sierakowski (author) (Search by this author)

Kacper Sierakowski ;

Michal Bockowski (author) (Search by this author)

Michal Bockowski ;

Hideki Sakurai (author) (Search by this author)

Hideki Sakurai ;

Tetsu Kachi (author) (Search by this author)

Tetsu Kachi ;

Takashi Sekiguchi (author) (Search by this author)

https://orcid.org/0000-0002-7365-9979 (unauthenticated)

National Institute for Materials Science

Takashi Sekiguchi ;

Kazuhiro Hono (author) (Search by this author)

https://orcid.org/0000-0001-7367-0193

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kazuhiro Hono

Keyword

gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy

Date published

2022-05-14

Updated at

2024-01-05 22:11:22 +0900