Menu
About
Help
Contact
表示言語の変更
日本語
English
Login
Login
Search MDR
Home
Article and Dataset
Collection
Resource type
Journal article(2)
Keyword
IMFP (2)
TPP-2M (2)
electron inelastic mean free paths (2)
elemental solids (2)
AES (1)
IMFPs (1)
XPS (1)
number of valence electrons (1)
surface analysis (1)
surface sensitivity (1)
(more)
License
File type
application/pdf (2)
Keyword: elemental solids
Reset all filters
2 records found. Displaying records 1 to 2.
Reset all filters
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
Journal article
Creator
Tanuma, Shigeo
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
Search by this author
)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell, C. J.
;
Penn, D. R.
(author) (
Search by this author
)
Penn, D. R.
Keyword
IMFP
,
TPP-2M
,
electron inelastic mean free paths
,
elemental solids
Date published
2011-02-08
Updated at
2024-01-05 22:14:03 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
Tanuma, Shigeo
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
Search by this author
)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell, C. J.
;
Penn, D. R.
(author) (
Search by this author
)
Penn, D. R.
Keyword
IMFP
,
TPP-2M
,
number of valence electrons
,
elemental solids
,
XPS
,
electron inelastic mean free paths
,
surface sensitivity
,
IMFPs
,
AES
,
surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Keyword
IMFP
(2)
TPP-2M
(2)
electron inelastic mean free paths
(2)
elemental solids
(2)
AES
(1)
IMFPs
(1)
XPS
(1)
number of valence electrons
(1)
surface analysis
(1)
surface sensitivity
(1)
RDE metadata def
RDE invoice schema
<
1
>
Filter
Collection
Resource type
Journal article(2)
Keyword
IMFP (2)
TPP-2M (2)
electron inelastic mean free paths (2)
elemental solids (2)
AES (1)
IMFPs (1)
XPS (1)
number of valence electrons (1)
surface analysis (1)
surface sensitivity (1)
(more)
License
File type
application/pdf (2)