Keyword: Bayesian estimation
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Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Journal article
Creator
Hiroshi Shinotsuka (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Shuichi Ogawa (author) (Search by this author)
;
Akitaka Yoshigoe (author) (Search by this author)
Keyword
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900
Shinotsuka2023_JES267_147370.pdf
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
Journal article
Creator
Hiroshi Shinotsuka (author) (Search by this author)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (Search by this author)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
ORCID SAMURAI ;
Malinda Siriwardana (author) (Search by this author)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
ORCID SAMURAI ;
Hayaru Shouno (author) (Search by this author)
Graduate School of Informatics and Engineering, The University of Electro-Communications
ORCID ;
Masato Okada (author) (Search by this author)
Graduate School of Frontier Science, The University of Tokyo
ORCID
Keyword
X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
Date published
2023-07-06
Updated at
2024-01-05 22:11:57 +0900
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data.pdf
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
Journal article
Creator
Ryo Murakami (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Taisuke T. Sasaki (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshitaka Matsushita (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Keitaro Sodeyama (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
Materials informatics, Spectral decomposition, Bayesian estimation, Feature selection, AI-ready
Date published
2024-12-31
Updated at
2025-11-10 16:30:53 +0900
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