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Journal article(2)
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Bayesian estimation (2)
X-ray photoelectron spectroscopy (2)
Exchange Monte Carlo method (1)
SESSA (1)
Silicon surface oxidation (1)
Statistical analysis (1)
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (2)
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Keyword: Bayesian estimation
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Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
Journal article
Creator
Hiroshi Shinotsuka
(author) (
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https://orcid.org/0000-0001-5147-1396
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Malinda Siriwardana
(author) (
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)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
Malinda Siriwardana
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Hayaru Shouno
(author) (
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https://orcid.org/0000-0002-2412-0184
(unauthenticated)
Graduate School of Informatics and Engineering, The University of Electro-Communications
Hayaru Shouno
;
Masato Okada
(author) (
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https://orcid.org/0000-0002-9040-8784
(unauthenticated)
Graduate School of Frontier Science, The University of Tokyo
Masato Okada
Keyword
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
Date published
2023-07-06
Updated at
2024-01-05 22:11:57 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Journal article
Creator
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shuichi Ogawa
(author) (
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)
Shuichi Ogawa
;
Akitaka Yoshigoe
(author) (
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)
Akitaka Yoshigoe
Keyword
Bayesian estimation
,
X-ray photoelectron spectroscopy
,
Statistical analysis
,
Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900
Keyword
Bayesian estimation
(2)
X-ray photoelectron spectroscopy
(2)
Exchange Monte Carlo method
(1)
SESSA
(1)
Silicon surface oxidation
(1)
Statistical analysis
(1)
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Collection
Resource type
Journal article(2)
Keyword
Bayesian estimation (2)
X-ray photoelectron spectroscopy (2)
Exchange Monte Carlo method (1)
SESSA (1)
Silicon surface oxidation (1)
Statistical analysis (1)
(more)
License
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (2)
File type
application/pdf (2)