2 records found.
Structure and Defect Identification at Self-Assembled Islands of CO2 Using Scanning Probe Microscopy
- Journal article
- Creator
-
Oscar Custance (author) (Search by this author)
;
;Emiliano Ventura-Macias (author) (Search by this author);Oleksandr Stetsovych (author) (Search by this author)Carlos Romero-Muñiz (author) (Search by this author)
https://orcid.org/0000-0001-6902-1553
(unauthenticated)
;
Tomoko K. Shimizu (author) (Search by this author)
https://orcid.org/0000-0002-1301-0406
(unauthenticated)
;
Pablo Pou (author) (Search by this author)
https://orcid.org/0000-0002-5854-8218
(unauthenticated)
;
Masayuki Abe (author) (Search by this author)
https://orcid.org/0000-0001-5619-3911
(unauthenticated)
;
Hironobu Hayashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Shigeki Kawai (author) (Search by this author)
;
Ruben Perez (author) (Search by this author)
https://orcid.org/0000-0001-5896-541X
(unauthenticated)
- Keyword
- CO2 islands, 1,4-phenylene diisocyanide, chirality, metal organic chains, atomic force microscopy, scanning tunneling microscopy, density functional theory
- Date published
- 2024-10-01
- Updated at
- 2025-09-17 08:30:31 +0900
Tip-Based Cleaning and Smoothing Improves Performance in Monolayer MoS2 Devices
- Journal article
- Creator
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;Sihan Chen (author) (Search by this author);Jangyup Son (author) (Search by this author);Siyuan Huang (author) (Search by this author)Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
;Rashid Bashir (author) (Search by this author);Arend M. van der Zande (author) (Search by this author)William P. King (author) (Search by this author)
- Keyword
- Van der Waals devices, atomic force microscopy, MoS2 transistors
- Date published
- 2021-02-09
- Updated at
- 2025-03-03 16:30:23 +0900