Keyword: Defects
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1-s2.0-S095522192500500X-main+(1)-圧縮.pdf
Strength-limiting defects evolved from heterogeneities during the sintering of high-purity submicron alumina powder
Journal article
Creator
Gaku Okuma (author) (Search by this author)
Research Center for Structural Materials/Materials Manufacturing Field/Ceramic Matrix Composites Group, National Institute for Materials Science
ORCID SAMURAI ;
Tsukasa Shimizugawa (author) (Search by this author)
Yokohama National University
;
Shingo Ozaki (author) (Search by this author)
Yokohama National University
;
Toshio Osada (author) (Search by this author)
Research Center for Structural Materials/Materials Manufacturing Field/High-Reliability Heat-Resistant Materials Group, National Institute for Materials Science
ORCID SAMURAI ;
Shingo Machida (author) (Search by this author)
JFCC
;
Yutaro Arai (author) (Search by this author)
Tokyo university of science
;
Ryo Inoue (author) (Search by this author)
Tokyo university of science
;
Hideki Kakisawa (author) (Search by this author)
Research Center for Structural Materials/Materials Manufacturing Field/Ceramic Matrix Composites Group, National Institute for Materials Science
ORCID SAMURAI ;
Yuki Sada (author) (Search by this author)
Japan Synchrotron Radiation Research Institute (JASRI)
;
Masayuki Uesugi (author) (Search by this author)
Japan Synchrotron Radiation Research Institute (JASRI)
;
Akihisa Takeuchi (author) (Search by this author)
Japan Synchrotron Radiation Research Institute (JASRI)
;
Fumihiro Wakai (author) (Search by this author)
Research Center for Structural Materials/Materials Manufacturing Field/Ceramic Matrix Composites Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
Sintering, Synchrotron X-ray tomography, Microstructure, Defects, Fracture
Date published
2025-07-16
Updated at
2025-07-23 12:30:20 +0900
APL26-AR-ICNS2026-02280.pdf
Stable structures of (VGaVN) n defects in bulk GaN
Journal article
Creator
Hiroyuki Ishihara (author) (Search by this author)
ORCID ;
Masato Oda (author) (Search by this author)
ORCID ; ORCID SAMURAI
Keyword
GaN, First-principles calculations, Large-scale DFT, Vacancy, Defects
Date published
2026-08-24
Updated at
2026-08-26 10:56:41 +0900
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