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X-ray nanobeam diffraction (1)
adhesion (1)
buried interface (1)
deformation and fracture processes (1)
polyrotaxane (1)
strain delocalization (1)
strain-distribution analysis (1)
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Keyword: X-ray nanobeam diffraction
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In Situ Analysis of Local Strain Distribution of Amorphous Polyrotaxane Adhesives Constrained by Metal Substrates
Journal article
Creator
Kazuaki Kato
(author) (
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)
https://orcid.org/0000-0002-9997-8599
(unauthenticated)
National Institute for Materials Science
Kazuaki Kato
;
Ayumu Takeshima
(author) (
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)
Ayumu Takeshima
;
Kenichiro Ryu
(author) (
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)
Kenichiro Ryu
;
Kohzo Ito
(author) (
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)
Kohzo Ito
;
Masanobu Naito
(author) (
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)
https://orcid.org/0000-0001-7198-819X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masanobu Naito
;
Yoshiki Kohmura
(author) (
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Yoshiki Kohmura
;
Taiki Hoshino
(author) (
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Taiki Hoshino
Keyword
adhesion
,
buried interface
,
X-ray nanobeam diffraction
,
strain-distribution analysis
,
deformation and fracture processes
,
polyrotaxane
,
strain delocalization
Date published
2024-06-13
Updated at
2025-06-19 08:30:18 +0900
Keyword
X-ray nanobeam diffraction
(1)
adhesion
(1)
buried interface
(1)
deformation and fracture processes
(1)
polyrotaxane
(1)
strain delocalization
(1)
strain-distribution analysis
(1)
RDE metadata def
RDE invoice schema
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