Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy

Journal article

Creator

Nobuyuki Ishida (author) (Search by this author)

https://orcid.org/0000-0003-0161-0583

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Nobuyuki Ishida ;

Takaaki Mano (author) (Search by this author)

https://orcid.org/0000-0002-6955-260X

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takaaki Mano

Keyword

Kelvin probe force microscopy, Simulation, GaAs(110)

Date published

2025-02-17

Updated at

2025-12-03 08:30:21 +0900