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Article and Dataset
Collection
MDR XAFS DB(1)
Resource type
Dataset(1)
Journal article(1)
Keyword
SiC (2)
2D materials (1)
BL-10 (1)
Carbide (1)
Graphene (1)
Intercalation (1)
Ritsumeikan-SR (1)
Si K-edge (1)
Silicon carbide (1)
Transmission Electron Microscopy (1)
(more)
License
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/json (1)
application/octet-stream (1)
application/pdf (1)
image/png (1)
text/tab-separated-values (1)
Chemical composition
Silicon carbide (1)
Analysis field
spectroscopy (1)
Measurement method
x-ray absorption spectroscopy (1)
Material type
Carbide (1)
Structural feature for specimen
local structure (1)
Instrument name
BL-10_XAFS (1)
Keyword: SiC
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XAFS spectrum of Silicon carbide
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
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)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
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)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon carbide
,
SiC
,
Si K-edge
,
Carbide
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
Date published
Updated at
2025-05-02 22:03:46 +0900
2D Iron Oxide at the Graphene/SiC(0001) Interface
Journal article
Creator
Ryotaro Sakakibara
(author) (
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)
https://orcid.org/0000-0001-7150-2831
(unauthenticated)
Ryotaro Sakakibara
;
Tomo‐o Terasawa
(author) (
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)
https://orcid.org/0000-0003-3027-6780
(unauthenticated)
Tomo‐o Terasawa
;
Taizo Kawauchi
(author) (
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)
https://orcid.org/0000-0001-6346-2059
(unauthenticated)
Taizo Kawauchi
;
Katsuyuki Fukutani
(author) (
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)
https://orcid.org/0000-0002-6270-3620
(unauthenticated)
Katsuyuki Fukutani
;
Takahiro Ito
(author) (
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)
https://orcid.org/0000-0003-2234-7315
(unauthenticated)
Takahiro Ito
;
Wataru Norimatsu
(author) (
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)
https://orcid.org/0000-0002-7866-1154
(unauthenticated)
Wataru Norimatsu
Keyword
2D materials
,
Graphene
,
SiC
,
Transmission Electron Microscopy
,
Intercalation
Date published
2026-03-14
Updated at
2026-04-27 08:49:30 +0900
Keyword
SiC
(2)
2D materials
(1)
BL-10
(1)
Carbide
(1)
Graphene
(1)
Intercalation
(1)
Ritsumeikan-SR
(1)
Si K-edge
(1)
Silicon carbide
(1)
Transmission Electron Microscopy
(1)
XAFS
(1)
collection - MDR XAFS DB
(1)
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Collection
MDR XAFS DB(1)
Resource type
Dataset(1)
Journal article(1)
Keyword
SiC (2)
2D materials (1)
BL-10 (1)
Carbide (1)
Graphene (1)
Intercalation (1)
Ritsumeikan-SR (1)
Si K-edge (1)
Silicon carbide (1)
Transmission Electron Microscopy (1)
(more)
License
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/json (1)
application/octet-stream (1)
application/pdf (1)
image/png (1)
text/tab-separated-values (1)
Chemical composition
Silicon carbide (1)
Analysis field
spectroscopy (1)
Measurement method
x-ray absorption spectroscopy (1)
Material type
Carbide (1)
Structural feature for specimen
local structure (1)
Instrument name
BL-10_XAFS (1)