Characterization of wide-gap semiconductors by photothermal deflection spectroscopy

ジャーナル論文

著者

Masatomo Sumiya (author) (この著者で検索)

https://orcid.org/0000-0003-0960-3812

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Masatomo Sumiya

キーワード

III-V nitride semiconductor, photothermal deflection spectroscopy, defect

刊行年月日

2023-11-01

更新時刻

2024-12-10 16:56:31 +0900