License: In Copyright Resource type: dataset
Reset all filters

25 records found.

2023-PVSC-Abstract-SnPSCs.pdf
Effect of Bidentate Ligand Additive in Tin Perovskite Solar Cells
Dataset
Creator
Dhruba B. Khadka SAMURAI ORCID ; Yasuhiro Shirai SAMURAI ORCID ; Masatoshi Yanagida SAMURAI ORCID ; Kenjiro Miyano SAMURAI ORCID
Keyword
Sn-perovskite, Sn-oxidation, bidentate ligand, Stability, Device
Date published
2023-06-11
Updated at
2024-09-17 16:30:25 +0900
Dataset
べき乗則で解釈されるスペクトルの閾値及びべき乗数の自動解析方法
Dataset
Creator
柳生 進二郎 SAMURAI ORCID ; 吉武 道子 SAMURAI ORCID ; 長田 貴弘 SAMURAI ORCID
Keyword
Power Law , Automatic estimation methods, threshold
Date published
2024-03-31
Updated at
2024-04-26 16:30:10 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-03-30 18:50:25 +0900
JFGMs_20200708.xlsx
FGMs Database: Journal of Functionally Graded Materials Vols. 28-34 (2014-2020)
Dataset
Creator
National Institute for Materials Science
Keyword
functionally graded materials
Date published
2020-07-08
Updated at
2023-01-31 20:14:04 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:12:25 +0900