Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

論文

著者

Seiichiro Ii

キーワード

transmission electron microscopy, energy dispersive X-ray spectroscopy, electron energy loss spectroscopy, grain boundary, interphase boundary

刊行年月日

2024-01-25

更新時刻

2024-04-02 16:30:27 +0900