Tip-Based Cleaning and Smoothing Improves Performance in Monolayer MoS₂ Devices

論文

著者

Sihan Chen ; Jangyup Son ; Siyuan Huang ; Kenji Watanabe ; Takashi Taniguchi ; Rashid Bashir ; Arend M. van der Zande ; William P. King

キーワード

Van der Waals devices, atomic force microscopy, MoS2 transistors

刊行年月日

2021-02-09

更新時刻

2025-03-03 16:30:23 +0900