Multiscale structural analysis of defective graphene in transmission electron microscopy images using persistent homology

ジャーナル論文

著者

Ryuto Eguchi (author) (この著者で検索)

https://orcid.org/0009-0003-2859-6934

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Ryuto Eguchi ;

Ayako Hashimoto (author) (この著者で検索)

https://orcid.org/0000-0002-1985-7667

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Ayako Hashimoto

キーワード

Electron microsocopy, Persistent homology, Graphene, In situ observation

刊行年月日

2026-01-01

更新時刻

2026-06-08 15:40:00 +0900