Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
- ジャーナル論文
- 著者
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Shunsuke Yamashita (author) (この著者で検索)
https://orcid.org/0000-0003-1702-1708
(unauthenticated)
;
;Sei Fukushima (author) (この著者で検索)Jun Kikkawa (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
;Ryoji Arai (author) (この著者で検索)Yuya Kanitani (author) (この著者で検索)
https://orcid.org/0009-0002-2154-5571
(unauthenticated)
;
Koji Kimoto (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
Yoshihiro Kudo (author) (この著者で検索) - キーワード
- defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES
- 刊行年月日
- 2024-03-01
- 更新時刻
- 2024-03-19 16:56:29 +0900
Stable structures of (VGaVN) n defects in bulk GaN
- ジャーナル論文
- 著者
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Hiroyuki Ishihara (author) (この著者で検索)
https://orcid.org/0009-0002-5824-430X
(unauthenticated)
;
Masato Oda (author) (この著者で検索)
https://orcid.org/0000-0002-8731-5122
(unauthenticated)
;
Tsuyoshi Miyazaki (author) (この著者で検索)
- キーワード
- GaN, First-principles calculations, Large-scale DFT, Vacancy, Defects
- 刊行年月日
- 2026-08-24
- 更新時刻
- 2026-08-26 10:56:41 +0900
Degradation of vertical GaN diodes during proton and xenon-ion irradiation
- ジャーナル論文
- 著者
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;Hironori Okumura (author) (この著者で検索);Yohei Ogawara (author) (この著者で検索);Manabu Togawa (author) (この著者で検索);Masaya Miyahara (author) (この著者で検索);Tadaaki Isobe (author) (この著者で検索);Kosuke Itabashi (author) (この著者で検索);Jiro Nishinaga (author) (この著者で検索)Masataka Imura (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Schottky barrier diode, MOCVD, Vertical-type PN junction diode, Proton, Xe, Radiation irradiations, GaN
- 刊行年月日
- 2023-06-01
- 更新時刻
- 2024-08-24 08:30:18 +0900