Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials

ジャーナル論文

著者

Seiichiro Ii (author) (この著者で検索)

https://orcid.org/0000-0003-3999-384X

National Institute for Materials Science

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Seiichiro Ii

キーワード

transmission electron microscopy, energy dispersive X-ray spectroscopy, electron energy loss spectroscopy, grain boundary, interphase boundary

刊行年月日

2024-01-25

更新時刻

2024-04-02 16:30:27 +0900