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Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Article
Creator
Tanuma, Shigeo SAMURAI ORCID ; Powell, C. J. ORCID ; Penn, D. R.
Keyword
IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900