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Tajiri_JSynchrotronRad_32_2025_125-132.pdf
Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering
Article
Creator
Hiroo Tajiri ORCID ; Shinji Kohara SAMURAI ORCID ; Koji Kimura ORCID ; Sekhar Halubai ; Haruto Morimoto ; Naohisa Happo ORCID ; Jens R. Stellhorn ORCID ; Yohei Onodera SAMURAI ORCID ; Xvsheng Qiao ORCID ; Daisuke Urushihara ORCID ; Peidong Hu ; Toru Wakihara ORCID ; Toyohiko Kinoshita ORCID ; Koichi Hayashi ORCID
Keyword
X-ray diffractometers, element-specific measurements, X-ray fluorescence holography, anomalous X-ray scattering
Date published
2025-01-01
Updated at
2024-12-26 16:30:51 +0900