File type: application/pdf Keyword: Silicon surface oxidation
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Shinotsuka2024_ApplSurfSci685_162001.pdf
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Article
Creator
Hiroshi Shinotsuka SAMURAI ORCID ; Kenji Nagata SAMURAI ORCID ; Hideki Yoshikawa SAMURAI ORCID ; Shuichi Ogawa ; Akitaka Yoshigoe
Keyword
Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900