In-situ transmission electron microscopy investigation of the deformation mechanism in CoCrNi and CoCrNiSi0.3 nanopillars

Article

Creator

Cheng-Ling Tai ; Jhen-De You ; Jia-Jun Chen ; Shu-Cheng Liang ; Tsai-Fu Chung ; Yo-Lun Yang ; Seiichiro Ii ; Takahito Ohmura ; Xiaoyang Zheng ; Chih-Yuan Chen ; Jer-Ren Yang

Keyword

In-situ compression transmission electron microscopy, CoCrNi nanopillar, Silicon addition, Deformation nanotwins, Dislocations

Date published

2024-10-15

Updated at

2025-10-21 15:50:50 +0900