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Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data.pdf
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
Journal article
Creator
Ryo Murakami (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Taisuke T. Sasaki (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hideki Yoshikawa (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshitaka Matsushita (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Keitaro Sodeyama (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Hiroshi Shinotsuka (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
Materials informatics, Spectral decomposition, Bayesian estimation, Feature selection, AI-ready
Date published
2024-12-31
Updated at
2025-11-10 16:30:53 +0900