Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Journal article

Creator

Hideyo Tsurusawa (author) (Search by this author)

https://orcid.org/0000-0001-9786-8997 (unauthenticated)

Hideyo Tsurusawa ;

Jun Uzuhashi (author) (Search by this author)

https://orcid.org/0000-0003-2023-8158

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Yusuke Kozuka (author) (Search by this author)

https://orcid.org/0000-0001-7674-600X

NIMS Researchers Directory SAMURAI

Yusuke Kozuka ;

Koji Kimoto (author) (Search by this author)

https://orcid.org/0000-0002-3927-0492

NIMS Researchers Directory SAMURAI

Koji Kimoto ;

Tadakatsu Ohkubo (author) (Search by this author)

https://orcid.org/0000-0003-3548-1951

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo

Keyword

TEM, FIB, Automation

Date published

2024-02-22

Updated at

2024-05-03 08:30:11 +0900