File type: application/pdf
Reset all filters

12 records found.

1MPo2B-12-FINAL-VERSION.pdf
Development of Super Fine Strand Nb3Al Cable for SuperKEKB Superconducting Sextupole Magnet System
Article
Creator
Norihito Ohuchi ORCID ; Akihiro Kikuchi SAMURAI ORCID ; Masaru Yamamoto ; Xudong Wang ; Kiyosumi Tsuchiya ORCID ; Kazuyuki Aoki ; Yasushi Arimoto ORCID ; Toshiyuki Oki ; Zhanguo Zong
Keyword
Nb3Al, 極細線, SuperKEKB
Date published
2023-03-06
Updated at
2024-01-25 11:44:01 +0900
【別刷り】極細素線を用いたNb3Sn撚線ケーブルの超伝導特性.pdf
極細素線を用いたNb3Snケーブルの超伝導特性
Article
Creator
王 旭東 ; 土屋 清澄, ; 寺島 昭男 ; 飯嶋 安男 SAMURAI ORCID ; 菊池 章弘 SAMURAI ORCID
Keyword
Nb3Sn, 極細線, 撚線, 曲げひずみ, 臨界電流
Date published
2023-07-20
Updated at
2024-01-05 22:13:36 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-03-30 18:50:25 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:12:25 +0900
HfO2-Fig8-Work-20220304-2.pdf
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Dataset
Creator
OGIWARA, Toshiya SAMURAI ORCID ; NAGATA, Takahiro SAMURAI ORCID ; YOSHIKAWA, Hideki SAMURAI ORCID
Keyword
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
Date published
2019-03-07
Updated at
2024-01-05 22:11:29 +0900