Nanoscale Origin of Strong Charge Carrier Scattering at Grain Boundaries in Orthorhombic SnSe Semiconductor Thin Films

Journal article

Creator

Xinyi He (author) (Search by this author)

Xinyi He ;

Kenji Matsuo (author) (Search by this author)

Kenji Matsuo ;

Takayoshi Katase (author) (Search by this author)

https://orcid.org/0000-0002-2593-7487 (unauthenticated)

Takayoshi Katase ;

Kota Hanzawa (author) (Search by this author)

https://orcid.org/0000-0002-0995-9360 (unauthenticated)

Kota Hanzawa ;

Hideto Yoshida (author) (Search by this author)

Hideto Yoshida ;

Shigenori Ueda (author) (Search by this author)

https://orcid.org/0000-0001-9425-0614

NIMS Researchers Directory SAMURAI

Shigenori Ueda ;

Hidenori Hiramatsu (author) (Search by this author)

https://orcid.org/0000-0002-5664-5831 (unauthenticated)

Hidenori Hiramatsu ;

Hideo Hosono (author) (Search by this author)

https://orcid.org/0000-0001-9260-6728

NIMS Researchers Directory SAMURAI

Hideo Hosono ;

Toshio Kamiya (author) (Search by this author)

Toshio Kamiya

Keyword

tin selenide, thermoelectric material, epitaxial film, carrier transport, defect, density functional theory

Date published

2025-04-25

Updated at

2025-05-15 08:38:54 +0900