Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

Journal article

Creator

Ralfy Kenaz (author) (Search by this author)

Ralfy Kenaz ;

Saptarshi Ghosh (author) (Search by this author)

Saptarshi Ghosh ;

Pradheesh Ramachandran (author) (Search by this author)

Pradheesh Ramachandran ;

Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Hadar Steinberg (author) (Search by this author)

Hadar Steinberg ;

Ronen Rapaport (author) (Search by this author)

Ronen Rapaport

Keyword

Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides

Date published

2023-05-23

Updated at

2025-02-14 12:30:58 +0900