Fabrication and characterization of single-crystalline CoSn(10-10) kagome metal thin films for interconnect applications: structure and anisotropic electrical resistivity

Journal article

Creator

Tomoya Nakatani (author) (Search by this author)

https://orcid.org/0000-0001-9590-216X

Research Center for Magnetic and Spintronic Materials/Magnetic Functional Device Group, National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Tomoya Nakatani ;

Nattamon Suwannaharn (author) (Search by this author)

https://orcid.org/0000-0003-1285-599X

Research Center for Structural Materials/Materials Evaluation Field/Microstructure Analysis Group, National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Nattamon Suwannaharn ;

Taisuke T. Sasaki (author) (Search by this author)

https://orcid.org/0000-0002-5952-7638

Research Center for Structural Materials/Materials Evaluation Field/Microstructure Analysis Group, National Institute for Materials Science

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Taisuke T. Sasaki

Keyword

interconnect, semiconductor, kagome, epitaxial, resistivity

Date published

2025-11-17

Updated at

2025-12-11 12:30:21 +0900