Point defects in BaSi2 identified and analyzed by electron paramagnetic resonance, photoluminescence and density functional theory

Journal article

Creator

Takuma Sato (author) (Search by this author)

Takuma Sato ;

Jean-Marie Mouesca (author) (Search by this author)

Jean-Marie Mouesca ;

Anne-Laure Barra (author) (Search by this author)

Anne-Laure Barra ;

Didier Gourier (author) (Search by this author)

Didier Gourier ;

Motoharu Imai (author) (Search by this author)

https://orcid.org/0000-0002-5848-113X

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Motoharu Imai ;

Takashi Suemasu (author) (Search by this author)

Takashi Suemasu ;

Serge Gambarelli (author) (Search by this author)

Serge Gambarelli

Keyword

silicide, semiconductor, point defects, electron paramagnetic resonance, density functional theory

Date published

2024-07-29

Updated at

2024-08-26 12:30:40 +0900