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Defect Passivation of 2D Semiconductors by Fixating Chemisorbed Oxygen Molecules via h‐BN Encapsulations
- Journal article
- Creator
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;Jin‐Woo Jung (author) (Search by this author);Hyeon‐Seo Choi (author) (Search by this author);Young‐Jun Lee (author) (Search by this author);Youngjae Kim (author) (Search by this author)Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
;Min‐Yeong Choi (author) (Search by this author);Jae Hyuck Jang (author) (Search by this author);Hee‐Suk Chung (author) (Search by this author);Dohun Kim (author) (Search by this author);Youngwook Kim (author) (Search by this author)Chang‐Hee Cho (author) (Search by this author) - Keyword
- Hexagonal boron nitride, defect-related gap states, WS2 crystals
- Date published
- 2024-03-17
- Updated at
- 2025-02-14 12:32:08 +0900