Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations

Journal article

Creator

Yuta Shuseki (author) (Search by this author)

Yuta Shuseki ;

Akihiko Fujiwara (author) (Search by this author)

Akihiko Fujiwara ;

Nobuhiko Mitoma (author) (Search by this author)

Nobuhiko Mitoma ;

Takio Kizu (author) (Search by this author)

Takio Kizu ;

Toshihide Nabatame (author) (Search by this author)

https://orcid.org/0000-0002-5973-0230

NIMS Researchers Directory SAMURAI

Toshihide Nabatame ;

Kazuhito Tsukagoshi (author) (Search by this author)

https://orcid.org/0000-0001-9710-2692

NIMS Researchers Directory SAMURAI

Kazuhito Tsukagoshi ;

Yohei Onodera (author) (Search by this author)

https://orcid.org/0000-0002-3080-6991

NIMS Researchers Directory SAMURAI

Yohei Onodera ;

Atsunobu Masuno (author) (Search by this author)

Atsunobu Masuno ;

Koji Ohara (author) (Search by this author)

Koji Ohara ;

Shinji Kohara (author) (Search by this author)

https://orcid.org/0000-0001-9596-2680

NIMS Researchers Directory SAMURAI

Shinji Kohara

Keyword

Amorphous indium oxide,, X-ray diffraction, Molecular dynamics simulation, Reverse Monte Carlo, Topological analysis, Thermal stability

Date published

2025-10-21

Updated at

2025-10-24 08:30:19 +0900