A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions

Journal article

Creator

H. Amekura (author) (Search by this author)

https://orcid.org/0000-0003-2148-8431

NIMS Researchers Directory SAMURAI

H. Amekura ;

K. Narumi (author) (Search by this author)

https://orcid.org/0000-0001-8569-0108 (unauthenticated)

K. Narumi ;

A. Chiba (author) (Search by this author)

A. Chiba ;

Y. Hirano (author) (Search by this author)

Y. Hirano ;

K. Yamada (author) (Search by this author)

K. Yamada ;

S. Yamamoto (author) (Search by this author)

S. Yamamoto ;

Y. Saitoh (author) (Search by this author)

Y. Saitoh ;

H. Segawa (author) (Search by this author)

https://orcid.org/0000-0002-7198-8410

NIMS Researchers Directory SAMURAI

H. Segawa

Keyword

ion track, C60 ion, Silicon, Synergy effect, Cluster effect

Date published

2026-06-17

Updated at

2026-06-18 14:50:54 +0900