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MDR XAFS DB(1)
Resource type
Dataset(1)
Journal article(1)
Keyword
Silicon nitride (2)
BL-10 (1)
Dielectric properties (1)
Nitride (1)
Ritsumeikan-SR (1)
SPS (1)
Si K-edge (1)
Si3N4 (1)
XAFS (1)
collection - MDR XAFS DB (1)
(more)
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Creative Commons BY Attribution 4.0 International (1)
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application/vnd.openxmlformats-officedocument.wordprocessingml.document (1)
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text/tab-separated-values (1)
Chemical composition
Silicon nitride (1)
Analysis field
spectroscopy (1)
Measurement method
x-ray absorption spectroscopy (1)
Material type
Nitride (1)
Structural feature for specimen
local structure (1)
Keyword: Silicon nitride
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2 records found.
Mechanical and Dielectric Properties of Si3N4-Based Ceramics
Journal article
Creator
M.V. Zamula,
(author) (
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)
IPMS NASU
M.V. Zamula,
;
V.G. Kolesnichenko
(author) (
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)
IPMS NASU
V.G. Kolesnichenko
;
A.V. Stepanenko
(author) (
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)
IPMS NASU
A.V. Stepanenko
;
N.I. Tyschenko
(author) (
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)
IPMS NASU
N.I. Tyschenko
;
O.V. Shyrokov
(author) (
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)
IPMS NASU
O.V. Shyrokov
;
V.V. Khardikov
(author) (
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)
V.N. Karazin Kharkiv National University
V.V. Khardikov
;
D.M. Demirskyi
(author) (
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)
IPMS NASU
D.M. Demirskyi
;
O.O. Vasylkiv
(author) (
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)
https://orcid.org/0000-0002-5041-6130
Research Center for Electronic and Optical Materials/Optical Materials Field/Polycrystalline Optical Material Group, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
O.O. Vasylkiv
;
H.Y. Borodianska
(author) (
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)
IPMS NASU
H.Y. Borodianska
;
A.V. Ragulya
(author) (
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)
IPMS NASU
A.V. Ragulya
Keyword
Silicon nitride
,
mechanical properties
,
hardness
,
fracture toughness
,
Dielectric properties
,
SPS
Date published
2025-04-01
Updated at
2025-05-02 10:26:05 +0900
XAFS spectrum of Silicon nitride
Dataset
Collection
MDR XAFS DB
Creator
Masashi Ishii
(editor) (
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)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Ritsumeikan SR Center
(author) (
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)
Ritsumeikan University
Ritsumeikan SR Center
Keyword
Silicon nitride
,
Si3N4
,
Si K-edge
,
Nitride
,
BL-10
,
Ritsumeikan-SR
,
XAFS
,
collection - MDR XAFS DB
Date published
Updated at
2025-05-02 21:38:36 +0900
Keyword
Silicon nitride
(2)
BL-10
(1)
Dielectric properties
(1)
Nitride
(1)
Ritsumeikan-SR
(1)
SPS
(1)
Si K-edge
(1)
Si3N4
(1)
XAFS
(1)
collection - MDR XAFS DB
(1)
fracture toughness
(1)
hardness
(1)
mechanical properties
(1)
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