On the efficacy of Xe+-pFIB preparation to avoid Ga+-FIB induced phase transformations in Al-Ni alloys

Journal article

Creator

Hendrik C. Jansen (author) (Search by this author)

https://orcid.org/0009-0004-3513-4348 (unauthenticated)

Hendrik C. Jansen ;

Amit Sharma (author) (Search by this author)

Amit Sharma ;

Krzysztof Wieczerzak (author) (Search by this author)

https://orcid.org/0000-0001-9976-7591 (unauthenticated)

Krzysztof Wieczerzak ;

Ganesh K. Nayak (author) (Search by this author)

Ganesh K. Nayak ;

Jochen M. Schneider (author) (Search by this author)

https://orcid.org/0000-0003-1239-1961 (unauthenticated)

Jochen M. Schneider ;

Jakob Schwiedrzik (author) (Search by this author)

Jakob Schwiedrzik ;

Thomas E.J. Edwards (author) (Search by this author)

https://orcid.org/0000-0002-3089-0062

NIMS Researchers Directory SAMURAI

Thomas E.J. Edwards ;

Johann Michler (author) (Search by this author)

Johann Michler

Keyword

Nanocrystalline aluminium, Intermetallic phases, Phase transformation, Gallium, Focused Ion Beam (FIB) sample preparation

Date published

2025-02-09

Updated at

2025-02-23 22:49:58 +0900