Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging

Journal article

Creator

Shunsuke Yamashita (author) (Search by this author)

https://orcid.org/0000-0003-1702-1708 (unauthenticated)

Shunsuke Yamashita ;

Sei Fukushima (author) (Search by this author)

Sei Fukushima ;

Jun Kikkawa (author) (Search by this author)

https://orcid.org/0000-0003-0659-1844

Center for Basic Research on Materials, National Institute for Materials Science (NIMS)

NIMS Researchers Directory SAMURAI

Jun Kikkawa ;

Ryoji Arai (author) (Search by this author)

Ryoji Arai ;

Yuya Kanitani (author) (Search by this author)

https://orcid.org/0009-0002-2154-5571 (unauthenticated)

Yuya Kanitani ;

Koji Kimoto (author) (Search by this author)

https://orcid.org/0000-0002-3927-0492

Center for Basic Research on Materials, National Institute for Materials Science (NIMS)

NIMS Researchers Directory SAMURAI

Koji Kimoto ;

Yoshihiro Kudo (author) (Search by this author)

Yoshihiro Kudo

Keyword

defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES

Date published

2024-03-01

Updated at

2024-03-19 16:56:29 +0900