Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator

ジャーナル論文

著者

Hiroshi Shinotsuka (author) (この著者で検索)

https://orcid.org/0000-0001-5147-1396

National Institute for Materials Science Research and Services Division of Materials Data and Integrated System

NIMS Researchers Directory SAMURAI

Hiroshi Shinotsuka ;

Kenji Nagata (author) (この著者で検索)

https://orcid.org/0000-0001-9894-4461

National Institute for Materials Science Research and Services Division of Materials Data and Integrated System

NIMS Researchers Directory SAMURAI

Kenji Nagata ;

Malinda Siriwardana (author) (この著者で検索)

National Institute for Materials Science Research and Services Division of Materials Data and Integrated System

Malinda Siriwardana ;

Hideki Yoshikawa (author) (この著者で検索)

https://orcid.org/0000-0002-7389-8865

National Institute for Materials Science Research and Services Division of Materials Data and Integrated System

NIMS Researchers Directory SAMURAI

Hideki Yoshikawa ;

Hayaru Shouno (author) (この著者で検索)

https://orcid.org/0000-0002-2412-0184 (unauthenticated)

The University of Electro-Communications Graduate School of Informatics and Engineering

Hayaru Shouno ;

Masato Okada (author) (この著者で検索)

https://orcid.org/0000-0002-9040-8784 (unauthenticated)

The University of Tokyo Graduate School of Frontier Science

Masato Okada

キーワード

X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA

刊行年月日

2023-07-06

更新時刻

2024-01-05 22:11:57 +0900