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Journal article(1)
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AES (1)
IMFP (1)
IMFPs (1)
TPP-2M (1)
XPS (1)
electron inelastic mean free paths (1)
elemental solids (1)
number of valence electrons (1)
surface analysis (1)
surface sensitivity (1)
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Keyword: surface analysis
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Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
Tanuma, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
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)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell, C. J.
;
Penn, D. R.
(author) (
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Penn, D. R.
Keyword
IMFP
,
TPP-2M
,
number of valence electrons
,
elemental solids
,
XPS
,
electron inelastic mean free paths
,
surface sensitivity
,
IMFPs
,
AES
,
surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Keyword
AES
(1)
IMFP
(1)
IMFPs
(1)
TPP-2M
(1)
XPS
(1)
electron inelastic mean free paths
(1)
elemental solids
(1)
number of valence electrons
(1)
surface analysis
(1)
surface sensitivity
(1)
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Collection
Resource type
Journal article(1)
Keyword
AES (1)
IMFP (1)
IMFPs (1)
TPP-2M (1)
XPS (1)
electron inelastic mean free paths (1)
elemental solids (1)
number of valence electrons (1)
surface analysis (1)
surface sensitivity (1)
(more)
License
File type
application/pdf (1)