Tip-Based Cleaning and Smoothing Improves Performance in Monolayer MoS₂ Devices

ジャーナル論文

著者

Sihan Chen (author) (この著者で検索)

Sihan Chen ;

Jangyup Son (author) (この著者で検索)

Jangyup Son ;

Siyuan Huang (author) (この著者で検索)

Siyuan Huang ;

Kenji Watanabe (author) (この著者で検索)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (この著者で検索)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Rashid Bashir (author) (この著者で検索)

Rashid Bashir ;

Arend M. van der Zande (author) (この著者で検索)

Arend M. van der Zande ;

William P. King (author) (この著者で検索)

William P. King

キーワード

Van der Waals devices, atomic force microscopy, MoS2 transistors

刊行年月日

2021-02-09

更新時刻

2025-03-03 16:30:23 +0900