Time-domain thermoreflectance technique using multiple delayed probe pulses for high-throughput data acquisition and analysis

Journal article

Creator

Hiroto Arima (author) (Search by this author)

National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST)

Hiroto Arima ;

Yuichiro Yamashita (author) (Search by this author)

Yuichiro Yamashita ;

Takashi Yagi (author) (Search by this author)

Takashi Yagi

Keyword

Time-domain thermoreflectance, multiple delay, thin film, thermal effusivity, interfacial thermal resistance, machine learning

Date published

2025-12-31

Updated at

2025-07-16 16:14:58 +0900