# Hydrogen-triggered metal filament rupture in Cu-based resistance switches

https://mdr.nims.go.jp/datasets/ff2e574c-8f06-4c44-a2c9-eb642b88947c

## File

- [Hydrogen-triggered metal filament rupture in Cu-based Resistance Switches.pdf](https://mdr.nims.go.jp/filesets/299e578c-971c-4133-8b29-bf97379c10f6/download) ([Detail](https://mdr.nims.go.jp/filesets/299e578c-971c-4133-8b29-bf97379c10f6.md))

## Id

ff2e574c-8f06-4c44-a2c9-eb642b88947c

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2024-03-04T05:55:11.531044Z

## Updated at

2025-07-16T07:16:24.155428Z

## Published at

2024-03-19T07:56:52.633138Z

## Doi

https://doi.org/10.48505/nims.4433

## First published url

https://doi.org/10.1080/14686996.2024.2318213

## Date published

2024-12-31

## Recorded date published

2024-12-31

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Hydrogen-triggered metal filament rupture in Cu-based resistance switches
  title_type: original
  lang: en

## Description

- description: Cation-based resistance switches have been considered as promising
    candidates for memory cells and other novel devices. So far, the most accepted
    switching processes of such devices are based on the formation/rupture of metallic
    filaments between two electrodes. Although many recent studies have identified
    the existence of H2O (and resulting -OH groups) in such devices, their effects
    on the switching process are still unclear. In the present work, by taking Cu/Ta2O5/Pt
    device as an example, we have theoretically revealed that H ions may dissociate
    from -OH groups and accumulate onto the Cu filament in amorphous Ta2O5. After
    that, the adsorbed H ions will induce a series of changes, such as the elongation
    of the adjacent Cu-Cu bonds, the weakening of the Cu-Cu bonds, the increase of
    charge on Cu cations, and the enhancement of diffusivities of Cu cations, all
    of which eventually lead to the rupture of the Cu filament. Interestingly, our
    proposed ‘H-triggered metal filament rupture’ model is similar to the widely studied
    ‘hydrogen embrittlement phenomenon’. The crucial point of this model is the high
    catalytic activity of Cu towards the splitting of -OH group. Consequently, it
    is expected that this model could be applicable to other Cu-cation based resistance
    switches.
  description_type: abstract
  lang: en

## Creator

- name: Bo Xiao
  role: author
  organization: Yantai University, Yantai, China
  department: The Laboratory of Theoretical and Computational Chemistry, School of
    Chemistry and Chemical Engineering
- name: Xuefang Yu
  role: author
- name: Wenzuo Li
  role: author
- name: Qingzhong Li
  role: author
- name: Satoshi Watanabe
  role: author

## Contact agent

- name: Alessandro Landi
  orcid: https://orcid.org/
  organization: CSIR-Advanced Materials Process Research Institute (AMPRI)
  department: Bhopal
  ror: https://ror.org/

## Publisher

organization: Taylor & Francis

## Managing organization



## Keyword

- subject: Resistance switch
  schema: not_defined
- subject: first-principles simulation
  schema: not_defined
- subject: rupture of metal filament
  schema: not_defined
- subject: hydrogen embrittlement
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by-nc/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Science and Technology of Advanced Materials
  issn: '14686996'
  volume: '25'
  article_number: " 2318213 "

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## Specimen



## Chemical composition



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## Fileset

- id: 299e578c-971c-4133-8b29-bf97379c10f6
  filename: Hydrogen-triggered metal filament rupture in Cu-based Resistance Switches.pdf
  content_type: application/pdf
  size: 4352915
  md5: b4b8e9c557a055ef66e1e8c665557b39

## Thumbnail

fileset_id: 299e578c-971c-4133-8b29-bf97379c10f6
filename: Hydrogen-triggered metal filament rupture in Cu-based Resistance Switches.pdf