Tomohide Morikawa
;
Masanori Kodera
;
Takao Shimizu
;
Keisuke Ishihama
;
Yoshitaka Ehara
;
Osami Sakata
;
Hiroshi Funakubo
説明:
(abstract)Thin films of Sr(Zr,Ti)O3 were investigated as buffer layers to induce tensile strain in ferroelectric thin films such as PbTiO3 and Pb(Zr,Ti)O3 to control the domain structure. By tuning the composition of Sr(Zr,Ti)O3, (100)-oriented PbTiO3 and Pb(Zr,Ti)O3 films were obtained, revealing that tensile strain was introduced into the thin films by the lattice of the buffer layer. We propose a methodology for the successive control of tensile stress, which is useful for understanding and controlling the domain structures of ferroelectric films that result in the ferroelectric and piezoelectric properties of ferroelectric thin films.
権利情報:
キーワード: Epitaxy, Ferroelectric domain, PZT, Tensile strain
刊行年月日: 2024-01-15
出版者: AIP Publishing
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.5208
公開URL: https://doi.org/10.1063/5.0180449
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-12-24 13:58:47 +0900
MDRでの公開時刻: 2024-12-24 13:58:47 +0900
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APL23-AR-10021.pdf
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サイズ | 647KB | 詳細 |