# XAFS spectrum of Tantalum silicide

https://mdr.nims.go.jp/datasets/f4aaff38-66b4-4790-9f79-d90384fbda6d

## File

- [metadata.all.json](https://mdr.nims.go.jp/filesets/bd575da9-e80a-4c5b-91d6-b020c6ef5aa3/download) ([Detail](https://mdr.nims.go.jp/filesets/bd575da9-e80a-4c5b-91d6-b020c6ef5aa3.md))
- [Ta-L3_TaSi2_Si111_50ms_200625.ex3](https://mdr.nims.go.jp/filesets/baa2d4a9-d6e7-4450-a9ec-1d6875bcbc67/download) ([Detail](https://mdr.nims.go.jp/filesets/baa2d4a9-d6e7-4450-a9ec-1d6875bcbc67.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/3bf0f5ae-fd4e-438f-aee4-fec14a69e2d8/download) ([Detail](https://mdr.nims.go.jp/filesets/3bf0f5ae-fd4e-438f-aee4-fec14a69e2d8.md))
- [Ta-L3_TaSi2_Si111_50ms_200625.txt](https://mdr.nims.go.jp/filesets/f97d77cf-fcf2-4789-b137-3f6c039c6280/download) ([Detail](https://mdr.nims.go.jp/filesets/f97d77cf-fcf2-4789-b137-3f6c039c6280.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/ddb5e00d-6a9b-4f95-be3e-802b36d5c28e/download) ([Detail](https://mdr.nims.go.jp/filesets/ddb5e00d-6a9b-4f95-be3e-802b36d5c28e.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/b07aa407-e07f-478a-8182-61f6317607b4/download) ([Detail](https://mdr.nims.go.jp/filesets/b07aa407-e07f-478a-8182-61f6317607b4.md))
- [TaSi2.thumb.png](https://mdr.nims.go.jp/filesets/02d5c730-0d26-4da6-b33a-72836e2142c3/download) ([Detail](https://mdr.nims.go.jp/filesets/02d5c730-0d26-4da6-b33a-72836e2142c3.md))
- [Ta-L3_TaSi2_Si111_50ms_200625.dat](https://mdr.nims.go.jp/filesets/3cfe9e06-58a5-4a48-ab9f-7f8e4bb2f91c/download) ([Detail](https://mdr.nims.go.jp/filesets/3cfe9e06-58a5-4a48-ab9f-7f8e4bb2f91c.md))

## Id

f4aaff38-66b4-4790-9f79-d90384fbda6d

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:20:33.199246Z

## Updated at

2025-05-02T13:06:37.657148Z

## Published at

2021-08-12T16:08:45.132472Z

## Doi

https://doi.org/10.48505/nims.2368

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-24

## Recorded date published

24/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Tantalum silicide
  title_type: original
  lang: en
- title: spring8.137103ae-c097-441a-a07c-bbaa76471aa6
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Ta L3-edge of Tantalum silicide measured at SPring-8 BL14B2, and is a part
    of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection
    of MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(111)
  schema: not_defined
- subject: TaSi2
  schema: not_defined
- subject: Ta L3-edge
  schema: not_defined
- subject: Silicide
  schema: not_defined
- subject: Tantalum silicide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2020-06-25T02:06:00Z'

## Specimen

- name: Tantalum silicide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q744
  material_type_description: Silicide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1718

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2643
  description: Ta L3-edge

## Software



## Custom property



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## Thumbnail

fileset_id: 02d5c730-0d26-4da6-b33a-72836e2142c3
filename: TaSi2.thumb.png