@misc{hideyo2024a,
  title = {Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy},
  author = {Hideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, Koji Kimoto, Tadakatsu Ohkubo},
  publisher = {Wiley},
  year = {2024-02-22},
  keywords = {TEM, FIB, Automation}
}