# XAFS spectrum of Tin(IV) oxide

https://mdr.nims.go.jp/datasets/f31840dc-6526-4778-af01-d1f2370af45e

## Files

- [metadata.all.json](https://mdr.nims.go.jp/filesets/13ad16de-1b20-4397-8a4e-3bd7ce86d3d4/download) ([Detail](https://mdr.nims.go.jp/filesets/13ad16de-1b20-4397-8a4e-3bd7ce86d3d4.md))
- [Sn-K_SnO2_Si311_50ms_170616_fe.txt](https://mdr.nims.go.jp/filesets/63682975-4096-4bc3-9abf-54a8a7c8fbb8/download) ([Detail](https://mdr.nims.go.jp/filesets/63682975-4096-4bc3-9abf-54a8a7c8fbb8.md))
- [metadata.all.yml](https://mdr.nims.go.jp/filesets/6d12b352-b0f1-42a8-a3d6-10830d16553d/download) ([Detail](https://mdr.nims.go.jp/filesets/6d12b352-b0f1-42a8-a3d6-10830d16553d.md))
- [Sn-K_SnO2_Si311_50ms_170616_fe.ex3](https://mdr.nims.go.jp/filesets/5cedc521-28a5-4f91-8033-d920946df379/download) ([Detail](https://mdr.nims.go.jp/filesets/5cedc521-28a5-4f91-8033-d920946df379.md))
- [Sn-K_SnO2_Si311_50ms_170616.ex3](https://mdr.nims.go.jp/filesets/f0934e88-1672-4b53-9ee4-9a06175dad37/download) ([Detail](https://mdr.nims.go.jp/filesets/f0934e88-1672-4b53-9ee4-9a06175dad37.md))
- [Sn-K_SnO2_Si311_50ms_170616.txt](https://mdr.nims.go.jp/filesets/902c0860-5a63-4c1c-a2f0-6c372627e55d/download) ([Detail](https://mdr.nims.go.jp/filesets/902c0860-5a63-4c1c-a2f0-6c372627e55d.md))
- [Sn-K_SnO2_Si311_50ms_170616.dat](https://mdr.nims.go.jp/filesets/9e71c05b-1feb-4f95-83b6-00f3aad0bcf8/download) ([Detail](https://mdr.nims.go.jp/filesets/9e71c05b-1feb-4f95-83b6-00f3aad0bcf8.md))
- [primary.tsv](https://mdr.nims.go.jp/filesets/781f1785-2b94-49c3-9fb6-921734f6e2e5/download) ([Detail](https://mdr.nims.go.jp/filesets/781f1785-2b94-49c3-9fb6-921734f6e2e5.md))
- [RDEmetainfo.xml](https://mdr.nims.go.jp/filesets/21704405-1917-4987-bda2-ea321e770a8e/download) ([Detail](https://mdr.nims.go.jp/filesets/21704405-1917-4987-bda2-ea321e770a8e.md))
- [SnO2.thumb.png](https://mdr.nims.go.jp/filesets/48803b3c-155a-40b1-8e22-61179c4bb9ee/download) ([Detail](https://mdr.nims.go.jp/filesets/48803b3c-155a-40b1-8e22-61179c4bb9ee.md))

## Id

f31840dc-6526-4778-af01-d1f2370af45e

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2021-08-05T08:26:56.578965Z

## Updated at

2025-05-02T13:06:17.657674Z

## Published at

2021-08-12T16:08:45.027139Z

## Doi

https://doi.org/10.48505/nims.2820

## First published url

https://support.spring8.or.jp/BL/bl14b2/xafs/standardDB/index-e.html

## Date published

2021-07-24

## Recorded date published

24/07/2021

## Resource type

dataset

## Manuscript type

na

## Collection

- id: a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  identifier: https://mdr.nims.go.jp/pid/a0f3fbf1-f94a-4be7-8a66-6b91a24f6b54
  title: MDR XAFS DB

## Title

- title: XAFS spectrum of Tin(IV) oxide
  title_type: original
  lang: en
- title: spring8.edc0287d-97ee-4ae2-99e3-6b9b79f9d8a3
  title_type: alternative
  lang: en

## Description

- description: This dataset consists of X-ray absorption fine structure (XAFS) spectra
    at Sn K-edge of Tin(IV) oxide measured at SPring-8 BL14B2, and is a part of XAFS
    database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of
    MDR
  description_type: abstract
  lang: en

## Creator

- name: Masashi Ishii
  role: editor
  orcid: https://orcid.org/0000-0003-0357-2832
  organization: National Institute for Materials Science
- name: Industrial Application and Partnership Division
  role: author
  organization: Japan Synchrotron Radiation Research Institute
  ror: https://ror.org/01xjv7358

## Contact agent

- name: Industrial Application and Partnership Division
  organization: Japan Synchrotron Radiation Research Institute

## Publisher

organization: SPring-8
ror: https://ror.org/01d1kv753

## Managing organization



## Keyword

- subject: collection - MDR XAFS DB
  schema: not_defined
- subject: XAFS
  schema: not_defined
- subject: SPring-8
  schema: not_defined
- subject: BL14B2
  schema: not_defined
- subject: Si(311)
  schema: not_defined
- subject: SnO2
  schema: not_defined
- subject: Sn K-edge
  schema: not_defined
- subject: Oxide
  schema: not_defined
- subject: Tin(IV) oxide
  schema: not_defined

## Rights

- description: Creative Commons BY Attribution 4.0 International
  identifier: https://creativecommons.org/licenses/by/4.0/
  date_licensed: 2025-05-01

## Other identifier(s)



## Data origin



## Embargo



## Journal



## Conference



## Related item



## Funding



## Instrument

- name: BL14B2_XAFS
  description: SPring-8 Engineering Science Research Beamline XAFS setup

## Instrument operator



## Instrument managing organization

- organization: Japan Synchrotron Radiation Research Institute
  department: Industrial Application and Partnership Division
  ror: 01xjv7358

## Measurement method

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q386
  category_description: x-ray absorption spectroscopy
  analysis_field_vocabulary: http://matvoc.nims.go.jp/entity/Q30
  analysis_field_description: spectroscopy
  description: Transmission
  measured_at: '2017-06-16T15:34:00Z'

## Specimen

- name: Tin(IV) oxide
  description: Standard Sample
  material_type_vocabulary: http://matvoc.nims.go.jp/entity/Q735
  material_type_description: Oxide

## Chemical composition

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q1704

## Structure for specimen



## Structural feature for specimen

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q686
  category_description: local structure
  description: Geometrical and electronic local structure around the absorption element

## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state

- category_vocabulary: http://matvoc.nims.go.jp/entity/Q2537
  description: Sn K-edge

## Software



## Custom property



## Fileset

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## Thumbnail

fileset_id: 48803b3c-155a-40b1-8e22-61179c4bb9ee
filename: SnO2.thumb.png