論文 Evaluation of stress tensor around a threading defect in diamond: Application of NV center-based measurement and comparative multi-modal analysis

Takeyuki Tsuji SAMURAI ORCID (National Institute for Materials Science) ; Shunta Harada ; Tokuyuki Teraji SAMURAI ORCID (National Institute for Materials Science)

コレクション

引用
Takeyuki Tsuji, Shunta Harada, Tokuyuki Teraji. Evaluation of stress tensor around a threading defect in diamond: Application of NV center-based measurement and comparative multi-modal analysis. Journal of Applied Physics. 2025, 138 (17), 174401. https://doi.org/10.1063/5.0292833

説明:

(abstract)

Threading defects in diamond degrade the performance of diamond-based quantum and electronic devices. Although the disorder of the atomic arrangement induced by the threading defects is considered to be the cause of the performance degradation, yet quantitative and spatially resolved evaluation of stress tensor that characterizes the magnitude of the disorder has remained challenging. In this study, we applied the evaluation technique of the stress tensor based on NV centers to the mapping of the stress field around a threading defect in a chemical vapor deposition (CVD) diamond film. Furthermore, we compared the stress tensor measured using NV centers with that obtained by conventional methods such as Raman spectroscopy and X-ray topography. Around the threading defect, the components of the stress tensor σxy, σyz, σzx, and σxx+σyy+σzz varied by approximately 0.2, 0.2, 0.3, and 1.2 GPa, respectively, and each component exhibited a rotationally symmetric distribution extending over a diameter of approximately 10 to 20 μm. We calculated the Raman shift mapping from the stress tensor obtained using NV centers and the Raman peak was estimated to decrease by approximately 0.9 cm⁻¹ due to the stress tensor at the center of the threading defect. This value was comparable to the experimental result of Raman shift mapping. These results indicate that the components of stress tensor measured by NV centers accurately reflect the stress induced by the threading defects. The stress tensor and X-ray topography images suggest that the threading defect measured in this study was a bundle dislocation.

権利情報:

キーワード: Crystallographic defects, Optically detected magnetic resonance,, Chemical vapor deposition, X-ray topography, Raman spectroscopy, Elasticity theory

刊行年月日: 2025-11-07

出版者: AIP Publishing

掲載誌:

  • Journal of Applied Physics (ISSN: 00218979) vol. 138 issue. 17 174401

研究助成金:

  • Ministry of Education, Culture, Sports, Science and Technology JPMXS0118068379
  • Japan Science and Technology Agency JPMJMS2062
  • Japan Science and Technology Agency JPMJAP24C1
  • Japan Society for the Promotion of Science 24H00406
  • Japan Society for the Promotion of Science 24K22963
  • JST Moonshot R&D JPMJMS2062
  • JST ASPIRE JPMJAP24C1

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1063/5.0292833

関連資料:

その他の識別子:

連絡先:

更新時刻: 2025-12-19 16:30:36 +0900

MDRでの公開時刻: 2025-12-19 14:11:36 +0900

ファイル名 サイズ
ファイル名 TTsuji_JAP138_174401(2025).pdf (サムネイル)
application/pdf
サイズ 2.65MB 詳細