# Photoelectron Holographic Study of Atomic Structure of Si Dopants for Si-doped κ-Ga<sub>2</sub>O<sub>3</sub>(001)

https://mdr.nims.go.jp/datasets/eb29afdb-2713-4336-bfa8-6e474eecd2b6

## File

- [再々投稿_260324.docx](https://mdr.nims.go.jp/filesets/b411aac5-d2bc-424a-91cc-c01b11c7c0bf/download) ([Detail](https://mdr.nims.go.jp/filesets/b411aac5-d2bc-424a-91cc-c01b11c7c0bf.md))

## Id

eb29afdb-2713-4336-bfa8-6e474eecd2b6

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-08-05T06:11:03.665929Z

## Updated at

2026-08-05T06:56:53.025658Z

## Published at

2026-08-05T09:28:00.884478Z

## Doi

https://doi.org/10.48505/nims.6445

## First published url

https://doi.org/10.1380/vss.69.346

## Date published

2026-07-10

## Recorded date published

2026

## Resource type

journal_article

## Manuscript type

accepted_manuscript

## Collection



## Title

- title: Photoelectron Holographic Study of Atomic Structure of Si Dopants for Si-doped
    κ-Ga<sub>2</sub>O<sub>3</sub>(001)
  title_type: original
  lang: en

## Description

- description: 既に出版している濃度とは異なるSiをドープしたk-Ga2O3を用い、濃度が異なることによるドーパントの原子構造、キャリア密度、ドーパントの活性サイト・不活性サイトの割合変化を議論した。
  description_type: abstract
  lang: und

## Creator

- name: Yoshiyuki YAMASHITA
  role: author
- name: Yuhua TSAI
  role: author
- name: Yusuke HASHIMOTO
  role: author
- name: Tomohiro MATSUSHITA
  role: author
- name: Piero MAZZOLINI
  role: author

## Contact agent



## Publisher

organization: Surface Science Society Japan

## Managing organization



## Keyword

- subject: Photoelectron Holography
  schema: not_defined
- subject: Ga2O3
  schema: not_defined
- subject: dopant
  schema: not_defined

## Rights

- identifier: http://rightsstatements.org/vocab/InC/1.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: Vacuum and Surface Science
  issn: '24335835'
  volume: '69'
  issue: '7'

## Conference



## Related item



## Funding



## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: b411aac5-d2bc-424a-91cc-c01b11c7c0bf
  filename: 再々投稿_260324.docx
  content_type: application/vnd.openxmlformats-officedocument.wordprocessingml.document
  size: 7543355
  md5: bbb4ac462d967388f6e65fe65f0c2bfe

## Thumbnail

fileset_id: b411aac5-d2bc-424a-91cc-c01b11c7c0bf
filename: 再々投稿_260324.docx