# Electrochemical Lithiation and Delithiation of Amorphous Nonstoichiometric Silicon Oxide Thin-Film Electrode Studied by                    <i>Operando</i>                    X-ray Photoelectron Spectroscopy

https://mdr.nims.go.jp/datasets/e95da878-0aff-4d1b-8450-74e98a54c48d

## File

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- [260204 SiOx Supporting Information.docx](https://mdr.nims.go.jp/filesets/d37a8e65-5312-4112-acca-cbcb5d2b0c59/download) ([Detail](https://mdr.nims.go.jp/filesets/d37a8e65-5312-4112-acca-cbcb5d2b0c59.md))

## Id

e95da878-0aff-4d1b-8450-74e98a54c48d

## Local identifier



## Visibility

open_to_public

## State

published

## Created at

2026-02-24T06:35:02.005640Z

## Updated at

2026-02-25T03:30:07.495584Z

## Published at

2026-02-25T01:40:31.114644Z

## Doi



## First published url

https://doi.org/10.1021/acs.jpclett.5c04065

## Date published

2026-02-19

## Recorded date published

2026-2-19

## Resource type

journal_article

## Manuscript type

vor

## Collection



## Title

- title: Electrochemical Lithiation and Delithiation of Amorphous Nonstoichiometric
    Silicon Oxide Thin-Film Electrode Studied by                    <i>Operando</i>                    X-ray
    Photoelectron Spectroscopy
  title_type: original
  lang: en

## Description

- description: 'Electrochemical lithiation/delithiation of a non-stoichiometric silicon
    oxide (SiOx) thin-film electrode on a Li6.6La3Zr1.6Ta0.4O12 were analyzed using
    operando X-ray photoelectron spectroscopy (XPS). At the pristine SiOx surface,
    bulk Si and SiOx peaks were observed and remained unchanged in the capacity density
    from 0 to ~1300 mAh gSi-1. At the capacity density of ~1400 mAh gSi-1, however,
    new peaks corresponding to Li~2.0Si and Li silicates appeared simultaneously with
    substantial decrease in the bulk Si and SiOx peaks. These results imply that,
    in the initial stage, lithiation of SiOx occurred at the SiOx/Li6.6La3Zr1.6Ta0.4O12
    interface to form LiySi and Li silicates, which was beyond the probing depth of
    XPS. Subsequently, lithiation gradually propagated into bulk and approached the
    probing depth of XPS as the composition reached Li~2.0Si, thereby elongating the
    ion conductive pathway. Thereafter, the position of LiySi peak reversibly responded
    to the state of charge because lithiation/delithiation occurred uniformly across
    the SiOx thin-film. '
  description_type: abstract
  lang: und

## Creator

- name: Tsukasa Iwama
  role: author
  orcid: https://orcid.org/0000-0002-1453-6936
- name: Ryosuke Sugimoto
  role: author
- name: Raimu Endo
  role: author
- name: Tsuyoshi Ohnishi
  role: author
  orcid: https://orcid.org/0000-0002-2333-7752
- name: Masakazu Haruta
  role: author
- name: Takayuki Doi
  role: author
  orcid: https://orcid.org/0000-0003-1081-9223
- name: Takuya Masuda
  role: author
  orcid: https://orcid.org/0000-0001-7462-2177

## Contact agent



## Publisher

organization: American Chemical Society (ACS)

## Managing organization



## Keyword

- subject: all-solid-state batteries
  schema: not_defined

## Rights

- identifier: https://creativecommons.org/licenses/by/4.0/

## Other identifier(s)



## Data origin

- data_origin_type: other

## Embargo



## Journal

- title: The Journal of Physical Chemistry Letters
  issn: '19487185'
  volume: '17'
  issue: '7'
  start_page: 2181
  end_page: 2190

## Conference



## Related item



## Funding

- identifier: JP20H05300
  funder_name: Japan Society for the Promotion of Science
- identifier: JPMJGX23S2
  funder_name: Japan Science and Technology Agency
- identifier: JPMJGX23S3
  funder_name: Japan Science and Technology Agency
- identifier: JPMJGX23S6
  funder_name: Japan Science and Technology Agency
- identifier: JPMJPF2016
  funder_name: Japan Science and Technology Agency

## Instrument



## Instrument operator



## Instrument managing organization



## Measurement method



## Specimen



## Chemical composition



## Structure for specimen



## Structural feature for specimen



## Specific property for specimen



## Process for specimen treatment



## Computational method



## Energy level/transition state



## Software



## Custom property



## Fileset

- id: 9cbf4555-6734-4caf-b014-eb5a6a8c2855
  filename: electrochemical-lithiation-and-delithiation-of-amorphous-nonstoichiometric-silicon-oxide-thin-film-electrode-studied-by.pdf
  content_type: application/pdf
  size: 5798405
  md5: 05fda76147f69d66dfb596ab622bc2ed
- id: d37a8e65-5312-4112-acca-cbcb5d2b0c59
  filename: 260204 SiOx Supporting Information.docx
  content_type: application/vnd.openxmlformats-officedocument.wordprocessingml.document
  size: 336146
  md5: 1edb7efc66ff199494454e0217866281

## Thumbnail

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filename: electrochemical-lithiation-and-delithiation-of-amorphous-nonstoichiometric-silicon-oxide-thin-film-electrode-studied-by.pdf